The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2015

Filed:

May. 21, 2013
Applicant:

Los Gatos Research, Mountain View, CA (US);

Inventors:

Manish Gupta, Mountain View, CA (US);

J. Brian Leen, Sunnyvale, CA (US);

Douglas S. Baer, Menlo Park, CA (US);

Assignee:

Los Gatos Research, Mountain View, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01N 21/59 (2006.01); G01J 3/42 (2006.01); G01N 21/3504 (2014.01); G01N 21/39 (2006.01);
U.S. Cl.
CPC ...
G01J 3/42 (2013.01); G01N 21/3504 (2013.01); G01N 21/39 (2013.01);
Abstract

A tunable mid-infrared laser operated in a pulsed mode is coupled off-axis into a high-finesse optical cavity to produce a long-path spectrometer. The cavity receives a gas sample. Laser pulses may be wavelength-scanned by stepping an external grating, allowing the grating to mechanically settle, then measuring the ring-down with a set of laser pulses, before moving on the next wavelength. A detector receiving infrared light exiting the cavity supplies a cavity ring-down trace representative of sample absorption of the infrared pulses. A processor determines an absolute absorption spectrum of the gas sample from the ring-down trace and analyzes sample gas composition and trace concentration from that spectrum. The absorption baseline is highly reproducible and stable, improving the accuracy of multivariate fits, and the spectral resolution can be better than 0.001 cm(contingent upon the laser source), allowing for high-resolution measurements of sharp absorption features.


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