The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Feb. 27, 2014
Fuji Xerox Co., Ltd., Tokyo, JP;
Hiroyuki Hotta, Kanagawa, JP;
Hideo Nakayama, Kanagawa, JP;
FUJI XEROX CO., LTD., Tokyo, JP;
Abstract
Provided is a measurement device including a light source that sequentially emits plural beams of light which are respectively incident on an object and of which optical axes are parallel or substantially parallel to each other, a condensing optical system that condenses the plural beams of light reflected from the object or the plural beams of light transmitted through the object, a light receiving unit, a light receiving surface of which is placed on a back focal plane of the condensing optical system, and that outputs a distribution or a center position of an intensity of light received in the light receiving surface, and a measurement unit that measures at least one of an angle and an angle distribution of a surface of the object, based on an output value output from the light receiving unit for each light applied to the object from the light source.