The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2015
Filed:
Dec. 02, 2010
Eiji Takahashi, Kobe, JP;
Naokazu Sakoda, Kobe, JP;
Toshiyuki Tsuji, Kobe, JP;
Hajime Takeda, Takasago, JP;
Masao Murakami, Takasago, JP;
Eiji Takahashi, Kobe, JP;
Naokazu Sakoda, Kobe, JP;
Toshiyuki Tsuji, Kobe, JP;
Hajime Takeda, Takasago, JP;
Masao Murakami, Takasago, JP;
Kobe Steel, Ltd., Hyogo, JP;
Abstract
Boundary lines which are contours of uneven marks are detected in a sample original image of the sidewall surface of a sample tire, and a mask image showing the position of the boundary lines is generated. Thereupon, a height offset image which shows a height of the uneven marks is generated by, in use of a plurality of discrete height threshold values, classifying the height of regions in the sample original image which remain after excluding regions corresponding to the positions of the boundary lines shown in the mask image. An unevenness-excluded image is generated by excluding the uneven marks from an inspection image of a sidewall surface of a tire under inspection, by subtracting the height offset image from the inspection image. A shape defect in the sidewall surface of the tire under inspection is inspected on the basis of the unevenness-excluded image.