The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Sep. 30, 2013
Applicant:

Samsung Electronics Co., Ltd., Gyeonggi-do, KR;

Inventors:

Eun-Yong Kim, Gyeonggi-do, KR;

Ho-Joong Kwon, Gyeonggi-do, KR;

Joseph Jeon, Gyeonggi-do, KR;

June Moon, Gyeonggi-do, KR;

Young-Goo Han, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 24/00 (2009.01); H04W 24/08 (2009.01); H04W 72/04 (2009.01);
U.S. Cl.
CPC ...
H04W 24/08 (2013.01); H04W 72/04 (2013.01);
Abstract

A method and apparatus are provided for determining channel quality in a wireless communication system. The method includes receiving Channel Quality Information (CQI) from a receiver; generating a channel quality reference value by correcting the received CQI using first resource use/nonuse information received from a scheduler that indicates whether an adjacent cell used resources at a previous time, and received signal power information measured in the adjacent cell; and determining a channel quality value at a current time using the generated channel quality reference value and second resource use/nonuse information received from the scheduler that indicates whether an adjacent cell uses resources at the current time.


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