The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Apr. 02, 2012
Applicants:
Jaewon Kim, Goyang-si, KR;
Ig Jae Kim, Goyang-si, KR;
Sang Chul Ahn, Seoul, KR;
Inventors:
Assignee:
Korea Institute of Science and Technology, Seoul, KR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/232 (2006.01); H04N 5/235 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23293 (2013.01); H04N 5/2354 (2013.01); H04N 5/23229 (2013.01); H04N 5/23212 (2013.01);
Abstract
A method that highlights a depth-of-field (DOF) region of an image and performs additional image processing by using the DOF region. The method includes: obtaining a first pattern image and a second pattern image that are captured by emitting light according to different patterns from an illumination device; detecting a DOF region by using the first pattern image and the second pattern image; determining weights to highlight the DOF region; and generating the highlighted DOF image by applying the weights to a combined image of the first pattern image and the second pattern image.