The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Oct. 01, 2013
Apple Inc., Cupertino, CA (US);
Yuehui Ouyang, Sunnyvale, CA (US);
Mattia Pascolini, San Mateo, CA (US);
Dean F. Darnell, Durham, NC (US);
Apple Inc., Cupertino, CA (US);
Abstract
A test station may include a test host, testing devices, and a test enclosure. A device under test (DUT) having a near-field communications (NFC) antenna may be placed in the test enclosure during production testing. The testing devices may have test antennas that may convey NFC test signals to the DUT in the test enclosure. Distances between test antennas and the DUT may be monitored by measuring path loss from the test antennas throughout testing. The testing station may also include a test unit and an RF test antenna. The test unit may use the RF test antenna to convey RF test signals to the DUT in the test enclosure. The DUT is marked as a passing DUT if gathered test data is satisfactory for each testing device in the test station and distance measurements between the test antennas and the DUT throughout testing are consistent with calibration measurements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile