The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Mar. 03, 2013
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Inventors:

Chihiro Arai, Kanagawa, JP;

Toshiya Uozumi, Kanagawa, JP;

Keisuke Ueda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03L 7/08 (2006.01); H03L 1/00 (2006.01); H03B 5/04 (2006.01); H03B 5/12 (2006.01); H03L 7/06 (2006.01); H03L 7/099 (2006.01);
U.S. Cl.
CPC ...
H03L 7/06 (2013.01); H03L 1/00 (2013.01); H03L 7/099 (2013.01); H03L 2207/06 (2013.01);
Abstract

A conventional semiconductor device has a problem that acquisition of variation information of circuit elements constructing the semiconductor device is not easy. According to an embodiment, a semiconductor device has a control circuit which makes an oscillation circuit operate by at least two operation current values, obtains first frequency information related to frequency of an output signal corresponding to a first operation current value and second frequency information related to frequency of an output signal corresponding to a second operation current value, and obtains manufacture variation information of a circuit element on the basis of the difference between the first and second frequency information.


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