The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Sep. 21, 2011
Applicants:

Soon-ryong Park, Yongin, KR;

Woo-suk Jung, Yongin, KR;

Hee-seong Jeong, Yongin, KR;

Tae-kyu Kim, Yongin, KR;

Sun-hwa Kim, Yongin, KR;

Inventors:

Soon-Ryong Park, Yongin, KR;

Woo-Suk Jung, Yongin, KR;

Hee-Seong Jeong, Yongin, KR;

Tae-Kyu Kim, Yongin, KR;

Sun-Hwa Kim, Yongin, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01); H01L 51/52 (2006.01); G02F 1/13 (2006.01); G02F 1/1339 (2006.01);
U.S. Cl.
CPC ...
H01L 51/5246 (2013.01); G02F 1/1309 (2013.01); G02F 1/1339 (2013.01); H01L 2251/568 (2013.01);
Abstract

A sealing inspection device for detecting a bonding error at a sealing region of an upper and a lower plate in a flat panel display apparatus in which the upper and lower plates are bonded to each other by a sealing member, the sealing inspection device includes a light source configured to emit light, a polarizer configured to polarize the light emitted from the light source, the polarized light being incident on and reflected from the sealing region of the flat panel display, an optical spectrum analyzer configured to analyze the light reflected from the sealing region with respect to wavelength ranges and to determine whether a bonding error exits at the sealing region, and a beam splitter configured to change a path of the reflected light toward the optical spectrum analyzer.


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