The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Jul. 27, 2012
Viswanath Annampedu, Schnecksville, PA (US);
Viswanath Annampedu, Schnecksville, PA (US);
LSI Corporation, San Jose, CA (US);
Abstract
Improved flaw scan circuits are provided for repeatable run out data. RRO (repeatable run out) data is processed by counting a number of RRO data bits detected in a servo sector; and setting an RRO flaw flag if at least a specified number of RRO data bits is not detected in the server sector. The RRO flaw flag can also optionally be set by detecting an RRO address mark in the servo sector; counting a number of samples in the servo sector after the RRO address mark that do not satisfy a quality threshold; and setting the RRO flaw flag when the counted number of samples that do not satisfy the quality threshold exceeds a specified flaw threshold. If the RRO flaw flag is set, the RRO data can be discarded, and/or an error recovery mechanism can be implemented to obtain the RRO data.