The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Dec. 28, 2010
Xavier Baele, Brussels, BE;
Julien Thollot, Woluwe-Saint-Lambert, BE;
Xavier Baele, Brussels, BE;
Julien Thollot, Woluwe-Saint-Lambert, BE;
SOFTKINETIC SOFTWARE, Brxelles, BE;
Abstract
The present invention relates to a method for stabilizing a series of measurements of a physical variable captured by a digital sensor. This method comprises the steps of: capturing at least a first measurement, a second measurement, and a third measurement of said physical variable and storing each measurement in a digital memory. The first and second measurements are compared and, if a difference between the first measurement and the second measurement is below a predetermined threshold, the second measurement is replaced in the memory by a corrected second measurement where the difference with respect to said first measurement has been reduced using a first filtering strength. The corrected second measurement and the third measurement are compared and, if a difference between the filtered value of the corrected second measurement and said third measurement is also below the threshold, said the third measurement is replaced by a corrected third measurement where a difference with respect to said corrected second measurement has been reduced using a second filtering strength that is lower than the first filtering strength. This method has the advantage of filtering noise while still allowing slow but relevant variations in the series of measurements.