The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 28, 2015

Filed:

Jan. 03, 2013
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Na-hyup Kang, Seoul, KR;

Tae-hyun Rhee, Yongin, KR;

Kyung-hwan Kim, Yongin, KR;

Do-kyoon Kim, Seongnam, KR;

Sang-wook Kim, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G06T 19/20 (2011.01);
U.S. Cl.
CPC ...
G06K 9/00362 (2013.01); G06T 7/0032 (2013.01); G06T 19/20 (2013.01); G06T 2207/10028 (2013.01); G06T 2207/30004 (2013.01); G06T 2210/41 (2013.01); G06T 2219/2021 (2013.01);
Abstract

A method of estimating an organ deformation model includes generating at least one 3D organ shape model of an organ of a subject based on at least one non-real time medical image representing a deformation state of the organ of the subject; generating a deformation space for the organ of the subject based on the at least one 3D organ shape model and prior knowledge regarding the organ; and estimating a 3D organ deformation model of the organ of the subject based on a real-time medical image of the organ of the subject and the deformation space.


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Kang, Na-hyup. (2015). Method and apparatus for estimating organ deformation model and medical image system (U.S. Patent No. 9092666). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9092666

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