The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Sep. 27, 2013
Applicant:
Emc Corporation, Hopkinton, MA (US);
Inventors:
Kai Chen, Shanghai, CN;
Jun Tao, Shanghai, CN;
Ping Chen, Shanghai, CN;
Michael John Dutch, Saratoga, CA (US);
Mark Chamness, Menlo Park, CA (US);
William Dale Andruss, Minneapolis, MN (US);
Bo Chen, Shanghai, CN;
Christopher Hercules Claudatos, San Jose, CA (US);
Assignee:
EMC Corporation, Hopkinton, MA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 11/00 (2006.01); G06F 9/44 (2006.01); G06F 11/36 (2006.01);
U.S. Cl.
CPC ...
G06F 11/362 (2013.01);
Abstract
A system for discovering bugs comprises an input interface and a processor. The input interface is configured to receive a bug definition. The bug definition includes a set operator with a time constraint and one or more set operands. The input interface is configured to receive an event log. The processor is configured to determine a list of bug occurrences using the bug definition and the event log.