The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Sep. 11, 2013
Applicant:
Sandisk Enterprise Ip Llc, Milpitas, CA (US);
Inventors:
Seungjune Jeon, Milpitas, CA (US);
Xiaoheng Chen, San Jose, CA (US);
Assignee:
SANDISK ENTERPRISE IP LLC, Milpitas, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/10 (2006.01); G06F 11/00 (2006.01); G06F 11/34 (2006.01); G06F 3/06 (2006.01); G06F 9/455 (2006.01); G06F 11/30 (2006.01);
U.S. Cl.
CPC ...
G06F 11/10 (2013.01); G06F 3/0604 (2013.01); G06F 11/004 (2013.01); G06F 11/3409 (2013.01); G06F 11/3037 (2013.01); G06F 2009/45583 (2013.01); H01L 2924/1438 (2013.01); H01L 2924/1443 (2013.01);
Abstract
Mechanisms are provided for detecting whether at least one of two or more portions of memory (e.g. chips, blocks, sectors, planes, pages, word lines, etc.) are more error-prone than the others, when portions of codewords are interleaved across the two or more portions of memory. Some implementations also enable various remedial operations that can be selectively employed in response to detecting an unbalanced error condition in order to reduce the risks associated with interleaving portions of codewords across two or more portions of memory.