The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Jun. 25, 2012
Michael E. Bappe, Loveland, CO (US);
Michael E. Bappe, Loveland, CO (US);
EMC Corporation, Hopkinton, MA (US);
Abstract
An improved technique for measuring I/O latency in an I/O driver of a host computing system includes obtaining the tick size of a high resolution clock of the host and setting the boundaries of I/O latency buckets at different calculated numbers of high resolution clock ticks. The I/O latency buckets are used for binning latency measurements made by the I/O driver. The boundaries of the I/O latency buckets are expressed as numbers of high resolution clock ticks and correspond to a sequence of predetermined time values. At runtime, the I/O driver measures the latency of I/O requests using timestamps obtained from the high resolution clock. The latency measurements are expressed as numbers of elapsed ticks. The I/O driver then assigns measured latency values to data buckets by comparing ticks to ticks, without the need for unit conversion or resource-intensive arithmetic.