The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Oct. 30, 2014
Applicants:
Mikiko Imazeki, Kanagawa, JP;
Yasushi Nakazato, Tokyo, JP;
Akira Takehisa, Tokyo, JP;
Osamu Satoh, Kanagawa, JP;
Inventors:
Mikiko Imazeki, Kanagawa, JP;
Yasushi Nakazato, Tokyo, JP;
Akira Takehisa, Tokyo, JP;
Osamu Satoh, Kanagawa, JP;
Assignee:
Ricoh Company, Ltd., Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G03G 15/00 (2006.01);
U.S. Cl.
CPC ...
G03G 15/55 (2013.01); G03G 15/553 (2013.01);
Abstract
A device failure predictor includes data acquisition unit to acquire internal data of a target device, a peak value calculator to calculate a plurality of peak values of the internal data for a prescribed period of time, and a failure sign identification unit to set individual criteria for the plurality of peak values and determine whether or not the target device shows signs of failure according to the plurality of peak values and the individual criteria.