The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Jul. 24, 2013
Jerome Charles Mertz, Newton, MA (US);
Kengyeh Ken Chu, Jamaica Plain, MA (US);
Ashwin Parthasarathy, Philadelphia, PA (US);
Jerome Charles Mertz, Newton, MA (US);
Kengyeh Ken Chu, Jamaica Plain, MA (US);
Ashwin Parthasarathy, Philadelphia, PA (US);
TRUSTEES OF BOSTON UNIVERSITY, Boston, MA (US);
Abstract
A partitioned aperture wavefront imaging system includes an imaging system comprising a partitioned aperture lens array positioned at the aperture plane or Fourier plane between the entrance plane and camera plane of an imaging system. The partitioned aperture lens array can include 2 or more off-axis lenses symmetrically distributed about an optical axis, and adapted to produce simultaneously at the camera plane at least two images of an object, or intermediate image of an object, presented at the entrance plane. Preferably, the partitioned aperture lens array includes from 3 to 5 off-axis lenses and produces 3 to 5 images at the camera plane from which phase and amplitude information about the light field can be determined. The partitioned aperture wavefront imaging system provides enough information about the light field presented at the entrance plane to enable reconstruction of the light field at other planes relative to the entrance plane.