The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Dec. 16, 2011
Chih-kuang Chang, New Taipei, TW;
Xian-yi Chen, Shenzhen, CN;
Zhong-kui Yuan, Shenzhen, CN;
Xiao-guang Xue, Shenzhen, CN;
Chih-Kuang Chang, New Taipei, TW;
Xian-Yi Chen, Shenzhen, CN;
Zhong-Kui Yuan, Shenzhen, CN;
Xiao-Guang Xue, Shenzhen, CN;
HONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Shenzhen, CN;
HON HAI PRECISION INDUSTRY CO., LTD., New Taipei, TW;
Abstract
A measuring device and method is used to select focusing points on an object. A CCD of the measuring device is positioned at the top of an initial focusing range, then moves to the bottom of the initial focusing range at a first speed to capture first images of the object. Image points corresponding to each focusing point in the first images are identified to compute coordinates of a first focal point of each focusing point. The initial focusing range is updated according to Z-coordinates of the first focal points. The CCD is positioned at the bottom of the updated focusing range, then, moves to the top of the updated focusing range at a second speed to capture second images of the object. Image points corresponding to each focusing point in the second images are identified to compute coordinates of a second focal point of each focusing point.