The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Jan. 27, 2012
Patrick T. Petruno, San Jose, CA (US);
John F. Petrilla, San Jose, CA (US);
Michael J. Brosnan, San Jose, CA (US);
Rong Zhou, San Jose, CA (US);
Daniel B. Roitman, San Jose, CA (US);
Patrick T. Petruno, San Jose, CA (US);
John F. Petrilla, San Jose, CA (US);
Michael J. Brosnan, San Jose, CA (US);
Rong Zhou, San Jose, CA (US);
Daniel B. Roitman, San Jose, CA (US);
Alverix, Inc., San Jose, CA (US);
Abstract
In one aspect, a diagnostic test system includes a housing, a reader, and a data analyzer. The housing includes a port for receiving a test strip. The reader obtains separable light intensity measurements from localized regions of an area of the detection zone exposed for optical inspection, wherein each of the localized regions is characterized by at least one surface dimension smaller than the first dimension. The data analyzer identifies ones of the light intensity measurements obtained from the at least one test region and computes at least one parameter from the identified ones of the light intensity measurements. In another aspect, the reader obtains a respective set of light intensity measurements from each of multiple corresponding regions of the exposed surface area of the detection zone, and the data analyzer computes at least one parameter from at least one of the sets of light intensity measurements.