The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 28, 2015
Filed:
Oct. 28, 2011
Dino Di Carlo, Los Angeles, CA (US);
Soojung Hur, Boston, MA (US);
Dino Di Carlo, Los Angeles, CA (US);
Soojung Hur, Boston, MA (US);
THE REGENTS OF THE UNIVERSITY OF CALIFORNIA, Oakland, CA (US);
Abstract
A particle analysis system includes an inlet; an inertial focusing microchannel disposed in a substrate and having a downstream expanding region at a distal end, where the inlet is connected to a proximal end of the microchannel; a plurality of outlets connected to the microchannel at the downstream expanding region; a plurality of fluidic resistors, where each fluidic resistor is connected to a respective outlet; and a particle analyzer configured to measure a size and a position of particles in the microchannel. A particle sorting system includes an inlet; an inertial focusing microchannel disposed in a substrate and having a downstream expanding region at a distal end, where the inlet is connected to a proximal end of the microchannel; a plurality of outlets connected to the microchannel at the downstream expanding region; and a plurality of fluidic resistors, where each fluidic resistor is connected to a respective outlet.