The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Jul. 25, 2012
Applicant:

Wei Deng, Sunnyvale, CA (US);

Inventor:

Wei Deng, Sunnyvale, CA (US);

Assignee:

OmniVision Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/445 (2011.01); H04N 5/232 (2006.01); H04N 5/247 (2006.01); H04N 5/262 (2006.01); H04N 5/225 (2006.01); H04N 5/45 (2011.01); H04N 21/431 (2011.01);
U.S. Cl.
CPC ...
H04N 5/44591 (2013.01); H04N 5/2258 (2013.01); H04N 5/23293 (2013.01); H04N 5/247 (2013.01); H04N 5/2621 (2013.01); H04N 5/2624 (2013.01); H04N 5/45 (2013.01); H04N 21/4316 (2013.01);
Abstract

According to a picture-in-picture (PIP) system and method, a first image sensor device detects light from a first subject and generates a first signal indicative of image data for the first subject. A second image sensor device detects light from a second subject and generates a second signal indicative of image data for the second subject. Overlay logic combines the first and second signals to generate a picture-in-picture signal indicative of a combination of an image of the first subject and an image of the second subject, wherein the overlay logic is located within the first image sensor device. The first image sensor device generates a synchronization signal which is received by the second image sensor device and triggers the second image sensor device to generate the second signal indicative of image data for the second subject.


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