The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Jul. 02, 2014
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Tadashi Kitai, Kanagawa, JP;
Hitomi Kaneko, Saitama, JP;
Hiroyoshi Ishizaki, Kanagawa, JP;
Keiji Kojima, Kanagawa, JP;
Keiichi Miyamoto, Kanagawa, JP;
Hiroyuki Kawamoto, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An inspection apparatus, inspection system, inspection method, and inspection control program stored in a recording medium, each of which sets a reference point in a master image and a read image read from a printed image, which is to be used for detecting the positional shift between the read image and the master image, based on determination whether a pattern previously added to the printed image for detecting the positional shift is available or can be used to effectively detect the positional shift.