The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Sep. 14, 2012
Applicants:

So-il Moon, Yongin-si, KR;

Jee-sang Hwang, Yongin-si, KR;

Su-hwan Kim, Yongin-si, KR;

Hyoung-no Lee, Yongin-si, KR;

Inventors:

So-Il Moon, Yongin-si, KR;

Jee-Sang Hwang, Yongin-si, KR;

Su-Hwan Kim, Yongin-si, KR;

Hyoung-No Lee, Yongin-si, KR;

Assignee:

SAMSUNG SDI CO., LTD., Yongin-si, Gyeonggi-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B05C 11/04 (2006.01); B05D 3/12 (2006.01); H01M 4/04 (2006.01); H01M 4/36 (2006.01); B05C 1/16 (2006.01); B05C 1/12 (2006.01); B05C 1/08 (2006.01); H01M 10/04 (2006.01); H01M 10/42 (2006.01); B05D 1/28 (2006.01);
U.S. Cl.
CPC ...
H01M 4/366 (2013.01); B05C 1/083 (2013.01); B05C 1/0817 (2013.01); B05C 1/0826 (2013.01); B05C 1/0856 (2013.01); B05C 1/0869 (2013.01); B05C 1/12 (2013.01); B05C 1/165 (2013.01); B05C 11/04 (2013.01); B05C 11/041 (2013.01); H01M 4/0402 (2013.01); H01M 4/0404 (2013.01); H01M 4/0409 (2013.01); H01M 10/0431 (2013.01); H01M 10/4235 (2013.01); B05D 1/28 (2013.01); Y02E 60/122 (2013.01);
Abstract

An apparatus and method for coating a functional layer on a current collector with an active material layer thereon, the apparatus including a first roll and a second roll, the first roll and second roll being for advancing the current collector; a gravure roll, the gravure roll being configured to coat the functional layer on the active material layer; a thickness measurer, the thickness measurer being configured to measure at least one of a thickness of the active material layer and a sum thickness of the active material layer and the functional layer; and a controller, the controller being in communication with the thickness measurer and being configured to control a rotation speed of the gravure roll.


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