The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Sep. 29, 2011
Applicants:

Yoichi Otsuka, Kanagawa, JP;

Akiko Ogino, Kumamoto, JP;

Kiyotaka Tabuchi, Kumamoto, JP;

Takamasa Tanikuni, Kumamoto, JP;

Inventors:

Yoichi Otsuka, Kanagawa, JP;

Akiko Ogino, Kumamoto, JP;

Kiyotaka Tabuchi, Kumamoto, JP;

Takamasa Tanikuni, Kumamoto, JP;

Assignee:

SONY CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 31/0232 (2014.01); H01L 27/146 (2006.01); H01L 27/148 (2006.01); H04N 9/04 (2006.01);
U.S. Cl.
CPC ...
H01L 27/14685 (2013.01); H01L 27/14621 (2013.01); H01L 27/14627 (2013.01); H01L 27/14818 (2013.01); H01L 27/14843 (2013.01); H04N 9/045 (2013.01);
Abstract

A solid-state imaging device includes a plurality of pixels formed on a semiconductor substrate and include a photoelectric conversion unit; a color filter on the pixels; an on-chip microlens made of an organic film on the color filter, corresponding to each of the pixels; a first inorganic film formed on a surface of the on-chip microlens and having a higher refraction index than the on-chip microlens; and a second inorganic film formed on a surface of the first inorganic film and having a lower refraction index than the on-chip microlens and the first inorganic film, in which at least the second inorganic film includes a non-lens area at an interface of an adjacent second inorganic film.


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