The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Feb. 20, 2013
Applicant:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Inventors:

Akiko Kakutani, Kanagawa, JP;

Kiyoshi Hashimoto, Kanagawa, JP;

Kiyokazu Sato, Tokyo, JP;

Takeshi Yoshiyuki, Kanagawa, JP;

Tsutomu Kurusu, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01J 49/16 (2006.01); H05H 1/46 (2006.01); H01J 37/32 (2006.01); H01J 27/24 (2006.01); H01J 37/30 (2006.01); A61N 5/10 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3299 (2013.01); H01J 27/24 (2013.01); H01J 37/30 (2013.01); H01J 37/32972 (2013.01); A61N 5/1067 (2013.01); A61N 2005/1088 (2013.01); H01J 37/32935 (2013.01); H01J 49/161 (2013.01); H01J 2237/0815 (2013.01); H05H 1/46 (2013.01);
Abstract

A laser-ablation plasma generator generates laser-ablation plasma from a target in a vacuum vessel. An ion beam extractor generates an ion beam by extracting ions included in the laser-ablation plasma from the vacuum vessel. An ion detector detects unintended ions other than intended ions, which are obtained by ionizing the elements in the target, out of ions in the vacuum vessel and outputs a detection signal representing a value which is a number of the unintended ions or a mixing ratio of the unintended ions to the intended ions as a detection result. The ion source using the laser beam makes it possible to normally monitor unintended ions other than intended ions out of ions in the vacuum vessel.


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