The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Aug. 06, 2010
Applicants:

Antonio Robles-kelly, Kaleen, AU;

Cong Phuoc Huynh, Braddon, AU;

Inventors:

Antonio Robles-Kelly, Kaleen, AU;

Cong Phuoc Huynh, Braddon, AU;

Assignee:

NATIONAL ICT AUSTRALIA LIMITED, Eveleigh, NSW, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/00 (2006.01); G06T 7/40 (2006.01);
U.S. Cl.
CPC ...
G06K 9/4661 (2013.01); G06K 9/00362 (2013.01); G06T 7/408 (2013.01); G06T 2207/10024 (2013.01); G06T 2207/20021 (2013.01); G06T 2207/30201 (2013.01);
Abstract

The disclosure concerns processing of electronic images, such as hyperspectral or multispectral images. Processing of the images includes object recognition and image enhancement in a way that harnesses the information available from the image based on the wavelength indexed spectral data these types of images provide. Illumination spectrum of such an image is estimated (FIG.) using a cost function based on a dichromatic reflection model and a constraint term. This method may be performed on sub-images of the image. A method for selecting these sub-images (FIG.) is also disclosed. A method of determining photometric parameters of the image given the estimated illumination spectrum (FIG.) is also disclosed.


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