The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Dec. 14, 2012
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Yoichi Kamei, Yokohama, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00771 (2013.01);
Abstract
An analysis apparatus analyzes an image and performs counting of the number of object passages. The analysis apparatus executes the counting and outputs the execution status of the counting.
Kamei, Yoichi. (2015). Analysis apparatus, analysis method, and storage medium (U.S. Patent No. 9087243). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9087243
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile