The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Jun. 09, 2006
Naresh Batra, Saratoga, CA (US);
Heena Nandu, Sunnyvale, CA (US);
Naresh Batra, Saratoga, CA (US);
Heena Nandu, Sunnyvale, CA (US);
Intelleflex Corporation, San Jose, CA (US);
Abstract
A system, method and computer program product according to one embodiment are provided for calibrating an RFID interrogator. A signal is sent from an interrogator to a calibration device. A backscatter signal is received from the calibration device. The backscatter from the calibration device is analyzed. An outgoing signal strength of the interrogator is adjusted based on the analysis. In a system, method and computer program product according to another embodiment, the interrogator is set to selectively respond to tags returning a backscatter signal strength selected based on the analysis. In a system, method and computer program product according to another embodiment, comparison criteria is selected based on the analysis of the backscatter signal. An RF device is instructed to store the comparison criteria, which is then used by the RF device to selectively respond to an interrogator signal having at least a desired strength.