The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

May. 30, 2012
Applicants:

Yuho Aoki, Tokyo, JP;

Shuji Endo, Tokyo, JP;

Kenichi Okamoto, Tokyo, JP;

Inventors:

Yuho Aoki, Tokyo, JP;

Shuji Endo, Tokyo, JP;

Kenichi Okamoto, Tokyo, JP;

Assignee:

NSK Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/30 (2006.01); G06F 11/07 (2006.01); G06F 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3024 (2013.01); G06F 11/0721 (2013.01); G06F 11/0739 (2013.01); G06F 11/0757 (2013.01); G06F 11/1641 (2013.01); G06F 11/3013 (2013.01); G06F 11/3055 (2013.01);
Abstract

An in-vehicle electronic control device for diagnosing the details of an abnormality of a microcomputer appropriately is provided. A monitoring function for detecting a malfunction by monitoring input/output of a main function of a hardware part and a monitoring function for detecting an abnormality by monitoring the calculating result of a main function in a software part are provided in a microcomputer. The main function to be monitored is implemented with a different structure than the malfunction/abnormality monitoring function. Furthermore, a malfunction processing circuit for monitoring an abnormality of the microcomputer is provided outside the microcomputer.


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