The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Jul. 24, 2012
Michael Weir, Boca Raton, FL (US);
Michael Weir, Boca Raton, FL (US);
Other;
Abstract
This Invention provides a system-level framework for an enterprise-level test environment. The environment provides test development, automation, and execution processes for product validation and verification, and allows the interoperability of test cases, data, equipment information, and results across various enterprise platforms. The system, with its processes and methods, provides various mechanisms for managing test configurations, developing test plans, managing test data, and developing test reports from one or more test-stations and/or from one or more test equipment(s) for one or more Device(s) Under Test (DUT). These mechanisms include, but are not limited to, functions such as data management and sharing, test library reusability, test station management, test configuration management, test execution, test report development, and data mapping/plotting. The system can be customized to support scalable enterprise requirements. The development of the standardized data handling and communication processes and methods allows inter-system communication and interoperability of test information across various platforms.