The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Apr. 26, 2012
Applicants:

Vinh B. LU, Austin, TX (US);

Bhyrav M. Mutnury, Austin, TX (US);

Terence Rodrigues, Austin, TX (US);

Inventors:

Vinh B. Lu, Austin, TX (US);

Bhyrav M. Mutnury, Austin, TX (US);

Terence Rodrigues, Austin, TX (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01); G01R 31/08 (2006.01); G06F 11/24 (2006.01); G01R 31/12 (2006.01); G01R 31/14 (2006.01);
U.S. Cl.
CPC ...
G06F 11/24 (2013.01); G01R 31/1227 (2013.01); G01R 31/14 (2013.01);
Abstract

A test structure for testing electrical properties of a material comprises a first loop and a second loop, which are connected to form a closed test loop. A signal generator, for generating a test signal, is coupled to the first loop and the second loop. A signal propagation switching logic is coupled to the first loop and to the second loop for alternatingly flipping the test signal between the first and second loops, such that the test signal moves uninterrupted through the closed test loop. A probe logic detects any degradation of the test signal as the test signal travels along the closed test loop.


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