The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Dec. 17, 2012
Fujitsu Limited, Kawasaki-shi, JP;
Takahiro Osada, Itabashi, JP;
Mamoru Arisumi, Kawasaki, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A test method which tests a processing device includes: obtaining a maximum number of processing units with which the processing device as a test target can simultaneously parallel process a plurality of threads; specifying a number of threads, causing the processing device as the test target to parallel process the threads, and obtaining a processing time corresponding to the number of threads; and outputting information indicating that the processing device as the test target is normal when the number of threads for which the processing time is more than or equal to a threshold matches the maximum number of processing units which can simultaneously parallel process, or outputting information indicating that the processing device as the test target is abnormal when the number of threads does not match.