The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Jul. 18, 2013
Applicant:

Wei Jiang, Piscataway, NJ (US);

Inventor:

Wei Jiang, Piscataway, NJ (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/035 (2006.01); G02F 1/01 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G02F 1/011 (2013.01); G01N 21/17 (2013.01);
Abstract

Systems and methods for controlling and measuring modes possessing even and odd symmetry in a slow-light photonic crystal waveguide. An example device comprises a photonic crystal waveguide having modes possessing even and odd symmetry, and a Mach-Zehnder coupler comprising two waveguide branches one of which has a phase adjuster. Another example device, which can be used as an optical isolator, comprises two Mach-Zehnder couplers, and a photonic crystal waveguide comprising an electro-optic modulator therein. A method of measuring a group index of a mode with odd symmetry comprises: coupling light into a photonic crystal waveguide through a Mach-Zehnder coupler with a mixed even/odd symmetry, measuring insertion loss of the combined light signal after passing through the photonic crystal waveguide, determining the spacings of adjacent peaks or valleys from the insertion loss versus wavelength plot, and using the spacings to determine the group index of the odd symmetry mode.


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