The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Feb. 02, 2011
Peter Tchoryk, Jr., Ann Arbor, MI (US);
David Michael Zuk, Dexter, MI (US);
David Keith Johnson, Canton, MI (US);
Charles J. Richey, San Francisco, CA (US);
Parviz Tayebati, Sherborn, MA (US);
Peter Tchoryk, Jr., Ann Arbor, MI (US);
David Michael Zuk, Dexter, MI (US);
David Keith Johnson, Canton, MI (US);
Charles J. Richey, San Francisco, CA (US);
Parviz Tayebati, Sherborn, MA (US);
Michigan Aerospace Corporation, Ann Arbor, MI (US);
Abstract
One of first and second beams () of corresponding first and second light () are projected into an atmosphere () and at least one physical property of the atmosphere () is detected from the interference pattern () generated from the resulting scattered light (). The first and second beams () are selected responsive to either a detected signal-to-noise ratio (SNR) or a detected aerosol-to-molecular ratio (AMR). The wavelength () of the first light () provides for either molecular or aerosol scattering, whereas the wavelength () of the second light () provides for primarily only aerosol scattering. In accordance with a second aspect, scattered light () from one or more beams () of substantially monochromatic light () projected into the atmosphere () and received from a plurality of interaction regions () or measurement volumes () provides for determining wind power (P*) within a region of the atmosphere ().