The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Mar. 28, 2012
Applicants:

Mostafa A. Karam, Moorpark, CA (US);

A. Douglas Meyer, Woodland Hills, CA (US);

Charles H. Volk, Newbury Park, CA (US);

Raj K. Shori, North Hills, CA (US);

Hector Macias, Newport Coast, CA (US);

Inventors:

Mostafa A. Karam, Moorpark, CA (US);

A. Douglas Meyer, Woodland Hills, CA (US);

Charles H. Volk, Newbury Park, CA (US);

Raj K. Shori, North Hills, CA (US);

Hector Macias, Newport Coast, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01); G01S 13/88 (2006.01); G01N 21/3581 (2014.01); G01J 5/10 (2006.01); G01K 11/00 (2006.01); G01N 21/3563 (2014.01);
U.S. Cl.
CPC ...
G01S 13/887 (2013.01); G01N 21/3581 (2013.01); G01J 5/10 (2013.01); G01K 11/006 (2013.01); G01N 21/3563 (2013.01);
Abstract

One embodiment of the invention includes a material detection system. The system includes a sensor system configured to collect radiation from a region of interest. The collected radiation can include a plurality of frequency bands. The system also includes a processing unit configured to detect a material of interest. The material of interest can be a concealed dielectric material, and the processing unit can be configured to decompose the collected radiation into natural resonance signals to analyze the natural resonance signals to detect an anomaly corresponding to the concealed dielectric material based on wave characteristics of the natural resonance signals. The processing unit could also include processing layers associated with the plurality of frequency bands for detecting and identifying the material of interest based on wave characteristics associated with each of the plurality of frequency bands of the collected radiation.


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