The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Jun. 06, 2013
Applicant:

Renesas Electronics Corporation, Kawasaki-shi, Kanagawa, JP;

Inventors:

Hiroki Wada, Kanagawa, JP;

Yoichi Maeda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3187 (2006.01); G01R 31/28 (2006.01); G01R 31/3185 (2006.01);
U.S. Cl.
CPC ...
G01R 31/2884 (2013.01); G01R 31/318555 (2013.01); G01R 31/318566 (2013.01);
Abstract

A power-on self-test circuit and a pattern generation circuit are provided. The power-on self-test circuit includes a selection circuit and a comparator circuit. The selection circuit selects, instead of an external pin group corresponding to a test access port, an output of the pattern generation circuit when a self-diagnosis execution signal is asserted and supplies a test pattern generated by the pattern generation circuit to a built-in self-test circuit. The comparator circuit compares a test result of a circuit-under-test with an expected value. By asserting the self-diagnosis execution signal in this manner, the semiconductor integrated circuit mounted on a user system executes BIST.


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