The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Jul. 12, 2012
Paul S. Rutherford, Maple Valley, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
Paul S. Rutherford, Maple Valley, WA (US);
Gary E. Georgeson, Tacoma, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
An inspection apparatus for nondestructive inspection/evaluation. The inspection apparatus may include a probe, and sensor, and a biasing spring. The probe may have a first end and a second, free end defining an opening. The sensor may be received in the opening. The biasing spring may be received in the opening in between the first end of the probe and the sensor to urge the sensor away from the first end of the probe. The probe may include a gimbal joint or ball and socket type joint and a spindle, where the joint provides for deflection of the probe relative to the spindle. A blocking pin for limiting the range of movement of the sensor retains part of the sensor in the opening. The sensor may have a position extending out of the opening, and a position where an end of the sensor is substantially flush with the end of the probe.