The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Mar. 11, 2011
Applicants:

Arnab Basu, Belmont, GB;

Ian Radley, Bishop Auckland Durham, GB;

Max Robinson, Shincliffe, GB;

Inventors:

Arnab Basu, Belmont, GB;

Ian Radley, Bishop Auckland Durham, GB;

Max Robinson, Shincliffe, GB;

Assignee:

Kromek Limited, Sedgefield, Durham, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/00 (2006.01); G01N 23/087 (2006.01);
U.S. Cl.
CPC ...
G01N 23/087 (2013.01);
Abstract

A detector device is described comprising an x-ray detector structure having a detection surface defining at least one separately addressable region for detecting incident x-ray radiation intensity thereon, wherein the separately addressable region is divided into a plurality of sub-regions provided on the detection surface each provided with a filter layer on the detection surface, the filter layers of a given separately addressable region comprising discrete and different materials with discrete defined and spectroscopically spaced x-ray absorption edges. A method of device manufacture, and an apparatus and method for the inspection and characterization of materials employing such a detector device, are also described.


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