The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

May. 15, 2013
Applicant:

Raytheon Company, Waltham, MA (US);

Inventors:

James R. Chow, San Gabriel, CA (US);

Bruce Hirano, Huntington Beach, CA (US);

David M. La Komski, Long Beach, CA (US);

Assignee:

RAYTHEON COMPANY, Waltham, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01K 15/00 (2006.01); G01J 5/52 (2006.01);
U.S. Cl.
CPC ...
G01J 5/522 (2013.01);
Abstract

An apparatus and method of calibrating a sensor. A voltage is applied to a first carbon nanotube layer to obtain a first temperature of the first carbon nanotube layer. A thermally conductive layer is used to provide a substantially uniform temperature related to the first temperature of the first carbon nanotube layer by smoothing a spatial variation of the first temperature. A second carbon nanotube layer receives the substantially uniform temperature and emits a first blackbody radiation spectrum to calibrate the sensor. The apparatus may be used to emit a second black body radiation spectrum by altering the applied voltage.


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