The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Nov. 09, 2012
Bruker Optik Gmbh, Ettlingen, DE;
Roland Harig, Waldbronn, DE;
Joern-Hinnrich Gerhard, Waldbronn, DE;
Bruker Optik GmbH, Ettlingen, DE;
Abstract
A method for the acquisition (AU) of a spectrally resolved, two-dimensional image by means of Fourier transform (FT) spectroscopy or Fourier transform infrared (FTIR) spectroscopy, is characterized in that, during multiple passes (D-D) of an optical path difference (OG) between two partial rays () over an identical range (IB), different subsets of detector elements () of an array detector () are read out and the signals of the read-out detector elements () of the multiple passes (D-D) are Fourier transformed and combined to form the spectrally resolved image. A method is thereby provided for the acquisition of two-dimensional, spectrally resolved images, in which the influence of vibrations on the measurement is reduced, and which is less affected by the movement of objects to the resolved spectrally.