The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 21, 2015
Filed:
Mar. 07, 2012
Applicants:
Harry C. Malecki, Abingdon, MD (US);
Randy L. Gaigler, Parkville, MD (US);
Corey A. Fleischer, Timonium, MD (US);
Han Liu, Lutherville-Timonium, MD (US);
Brandon K. Malet, Baltimore, MD (US);
Samuel J. Markkula, Rising Sun, MD (US);
Inventors:
Harry C. Malecki, Abingdon, MD (US);
Randy L. Gaigler, Parkville, MD (US);
Corey A. Fleischer, Timonium, MD (US);
Han Liu, Lutherville-Timonium, MD (US);
Brandon K. Malet, Baltimore, MD (US);
Samuel J. Markkula, Rising Sun, MD (US);
Assignee:
APPLIED NANOSTRUCTURED SOLUTIONS, LLC, Baltimore, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 16/00 (2006.01); C01B 31/02 (2006.01); B82Y 30/00 (2011.01); B82Y 40/00 (2011.01); C23C 16/52 (2006.01); G01R 27/08 (2006.01); D04H 1/00 (2006.01); D04H 3/00 (2012.01); D04H 5/00 (2012.01); D04H 13/00 (2006.01); B32B 17/12 (2006.01); B32B 18/00 (2006.01); B32B 27/04 (2006.01); B32B 27/12 (2006.01); G01N 27/04 (2006.01); B82Y 35/00 (2011.01);
U.S. Cl.
CPC ...
C01B 31/0206 (2013.01); B82Y 30/00 (2013.01); B82Y 40/00 (2013.01); B82Y 35/00 (2013.01); G01N 27/04 (2013.01);
Abstract
A quality control system for the manufacture of carbon nanostructure-laden substrates includes a resistance measurement module for continuously measuring resistance of the carbon nanostructure (CNS)-laden substrate.