The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 21, 2015

Filed:

Sep. 06, 2010
Applicants:

Sven Biederer, Luebeck, DE;

Timo Frederik Sattel, Luebeck, DE;

Tobias Knopp, Luebeck, DE;

Thorsten Manuel Buzug, Gross Sarau, DE;

Inventors:

Sven Biederer, Luebeck, DE;

Timo Frederik Sattel, Luebeck, DE;

Tobias Knopp, Luebeck, DE;

Thorsten Manuel Buzug, Gross Sarau, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 5/05 (2006.01); A61N 2/02 (2006.01);
U.S. Cl.
CPC ...
A61B 5/05 (2013.01); A61B 5/0515 (2013.01); A61N 2/02 (2013.01);
Abstract

The present invention relates to an MPI (Magnetic Particle Imaging) apparatus and a method for influencing and/or detecting magnetic particles in a field of view. Rather than moving the FFP (field free point) along a single, time-consuming high density trajectory it is proposed to use a number of low density trajectories with travelling phase, wherein each of said low density trajectories has the form of a closed curve differently located within the field of view.


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