The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Dec. 21, 2012
Applicant:

Apple Inc., Cupertino, CA (US);

Inventors:

Joshua G. Nickel, San Jose, CA (US);

Jr-Yi Shen, Sunnyvale, CA (US);

Anand Lakshmanan, Sunnyvale, CA (US);

Jayesh Nath, Milpitas, CA (US);

Matthew A. Mow, Los Altos, CA (US);

Mattia Pascolini, Campbell, CA (US);

Vishwanath Venkataraman, Pleasanton, CA (US);

Peter Bevelacqua, San Jose, CA (US);

Xin Cui, San Ramon, CA (US);

Assignee:

Apple Inc., Cupertino, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/04 (2006.01); H04W 24/00 (2009.01); G01R 31/28 (2006.01); H04B 17/12 (2015.01); G01R 27/26 (2006.01); G01R 29/08 (2006.01); G01R 27/28 (2006.01); G01R 29/10 (2006.01);
U.S. Cl.
CPC ...
H04W 24/00 (2013.01); G01R 31/2822 (2013.01); H04B 17/12 (2015.01); G01R 27/26 (2013.01); G01R 27/28 (2013.01); G01R 29/08 (2013.01); G01R 29/10 (2013.01);
Abstract

A wireless electronic device may contain at least one adjustable antenna tuning element for use in tuning the operating frequency range of the device. The antenna tuning element may include radio-frequency switches, continuously/semi-continuously adjustable components such as tunable resistors, inductors, and capacitors, and other load circuits that provide desired impedance characteristics. A test system that is used for performing passive radio-frequency (RF) testing on antenna tuning elements in partially assembled devices is provided. The test system may include an RF tester and a test host. The tester may be used to gather scattering parameter measurements from the antenna tuning element. The test host may be used to ensure that power and appropriate control signals are being supplied to the antenna tuning element so that the antenna tuning element is placed in desired tuning states during testing.


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