The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Jan. 28, 2014
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Kazunori Takayama, Hachioji, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/228 (2006.01); G03B 17/00 (2006.01); H04N 5/232 (2006.01);
U.S. Cl.
CPC ...
H04N 5/23254 (2013.01);
Abstract
An offset corresponding to an amount of geometric deformation is added to an amount of drive of an optical member due to an optical image shake correction so that the center of a reference area necessary for geometric deformation processing comes closer to the center of an imaging area. Because of this, a possibility is increased that a reference area necessary for geometric deformation processing is fully contained in an imaging area, and blurring of an image due to a motion of an image capture apparatus is effectively corrected by combining an optical image shake correction and a geometric deformation process.