The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Aug. 05, 2014
Applicant:

Emc Corporation, Hopkinton, MA (US);

Inventors:

Anthony Bennett Bishop, Charlotte, NC (US);

Alexis Salvatore Pecoraro, Huntersville, NC (US);

Paul John Wanish, Concord, NH (US);

Sheppard Narkier, Charlotte, NC (US);

Assignee:

EMC Corporation, Hopkinton, MA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); G06F 15/173 (2006.01); H04L 29/06 (2006.01); H04L 12/26 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1433 (2013.01); H04L 43/04 (2013.01);
Abstract

A method for facilitating forensic analysis of operational data for an IT infrastructure includes deriving performance data from a plurality of physical systems, network elements and storage devices in an IT infrastructure via a toolset comprising a plurality of IT monitoring and metrics tools, importing the performance data into an integrated forensics platform, aggregating the imported data, and analyzing the aggregated data to determine resources consumed. Each tool is communicatively interfaced with one or more of the physical systems, network elements and storage devices.


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