The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Dec. 31, 2013
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Reza Hoshyar, San Jose, CA (US);

Anuj Batra, Dallas, TX (US);

Timothy Mark Schmidl, Dallas, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 1/10 (2006.01); H04L 25/02 (2006.01); H04L 27/26 (2006.01);
U.S. Cl.
CPC ...
H04L 25/0202 (2013.01); H04L 25/022 (2013.01); H04L 25/023 (2013.01); H04L 25/0204 (2013.01); H04L 27/26 (2013.01);
Abstract

A device for updating complex channel gain estimates for orthogonal frequency division multiplexed (OFDM) symbols that includes a receiver to receive a plurality of OFDM symbols, wherein each OFDM symbol includes a plurality of pilot tones at a subset of odd positions and a finite impulse response (FIR) filter. The FIR filter configured to filter a plurality of initial channel estimates of odd tones of an OFDM symbol using a first set of coefficients to generate an updated estimate of the channel estimates of the plurality of odd tones for that OFDM symbol, and filter the plurality of the initial channel estimates of the odd tones of the OFDM symbol using a second set of coefficients to generate estimates for a plurality of initial channel estimates of even tones for that OFDM symbol.


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