The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Oct. 01, 2013
Ixia, Calabasas, CA (US);
David Jennings Wicker, Jr., Hillsboro, OR (US);
Lester Noel Stott, Aloha, OR (US);
Jeffrey Dean Marker, Sherwood, OR (US);
Alexander David Rekow, Portland, OR (US);
Thomas Alexander, Mulino, OR (US);
Ixia, Calabasas, CA (US);
Abstract
Systems and methods are disclosed herein to provide communication test systems for the testing of multiple-input multiple-output (MIMO) radio frequency wireless data communication devices, systems and networks, including Multi-User MIMO (MU-MIMO) devices and systems. In accordance with one or more embodiments, a test system containing an integrated MIMO signal analyzer is disclosed that includes a protocol engine operative in conjunction with a waveform generator and waveform analyzer that analyzes the signal waveform of a device under test. Such a test system may offer improved capabilities such as a simpler and more flexible measurement of complex MIMO signal waveforms, more automated measurements of MIMO waveforms including beamforming functions, and more accurate measurement of the efficiency of MIMO related functions such as channel estimation, transmit precoding and beamforming.