The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
Feb. 28, 2014
Hitachi-lg Data Storage, Inc., Tokyo, JP;
Masayoshi Miura, Tokyo, JP;
HITACHI-LG DATA STORAGE, INC., Tokyo, JP;
Abstract
Disclosed is a data archive system that executes inspection of a recording quality of an optical disc, estimates a recording quality deterioration factor, and informs it to a user, and a method for estimating the recording quality deterioration factor. The data archive system has a server and a data library device. The server has a whole control part, a data library I/F part, and a recording medium. The data library device has multiple recording media, a recording medium storing part, multiple recording/reproducing parts, and a library control part. The recording medium stores attribute information about the recording medium. The whole control part executes first quality inspection on a first recording medium, executes second quality inspection on a second recording medium, refers to attribute information of the recording media recorded on the information recording medium, and controls so that a factor deteriorating the qualities of the recording media may be estimated.