The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

Dec. 19, 2012
Applicant:

Western Digital (Fremont), Llc, Fremont, CA (US);

Inventors:

Yan Chen, Fremont, CA (US);

Donghong Li, Pleasanton, CA (US);

Ronghui Zhou, Fremont, CA (US);

Lien-Chang Wang, Fremont, CA (US);

Lily Yao, Hayward, CA (US);

Ming Jiang, San Jose, CA (US);

Assignee:

Western Digital (Fremont), LLC, Fremont, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04R 31/00 (2006.01); G11B 5/127 (2006.01); G11B 5/31 (2006.01); B24B 49/10 (2006.01); G11B 5/39 (2006.01); B24B 37/04 (2012.01);
U.S. Cl.
CPC ...
G11B 5/127 (2013.01); B24B 37/04 (2013.01); B24B 49/10 (2013.01); G11B 5/31 (2013.01); G11B 5/315 (2013.01); G11B 5/3116 (2013.01); G11B 5/39 (2013.01); H04R 31/00 (2013.01); Y10T 29/49039 (2015.01); Y10T 29/49043 (2015.01); Y10T 29/49044 (2015.01); Y10T 29/49046 (2015.01); Y10T 29/49048 (2015.01); Y10T 29/49052 (2015.01);
Abstract

Methods for manufacturing electronic lapping guides (ELGs) for writer heads that closely track the pole formation of the writer heads are provided. Once such method includes forming an ELG adjacent to a writer head that is subjected to substantially all of the sub-processing actions associated with the pole formation of the writer head, lapping the pole material, measuring a resistance of the ELG during the lapping, comparing the measured resistance with a target resistance, and terminating the lapping based on the comparison of the measured resistance with the target resistance.


Find Patent Forward Citations

Loading…