The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 14, 2015
Filed:
May. 16, 2013
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Taro Hiroike, Yamato, JP;
Assignee:
CANON KABUSHIKI KAISHA, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2006.01); G06T 5/00 (2006.01); G06T 5/50 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 5/002 (2013.01); G06T 5/50 (2013.01); G06T 2207/10016 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/30004 (2013.01);
Abstract
Provided is a technique to improve both the image quality of a radiation image and the operability of a radiation imaging apparatus. In the present invention, three or more unirradiated images are obtained before capturing a radiation image, and a temporal change in the amount of electric charges in each pixel is approximated using a non-linear function. At this time, the amount of residual electric charges is determined by evaluating a coefficient of determination of an approximate equation, and the most appropriate offset correction processing method is selected in accordance with the status of the determination.