The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2015

Filed:

May. 20, 2011
Applicants:

Adam T. Kalai, Cambridge, MA (US);

Omer Tamuz, Jerusalem, IL;

Ce Liu, Arlington, MA (US);

Ohad Shamir, Cambridge, MA (US);

Serge J. Belongie, San Diego, CA (US);

Inventors:

Adam T. Kalai, Cambridge, MA (US);

Omer Tamuz, Jerusalem, IL;

Ce Liu, Arlington, MA (US);

Ohad Shamir, Cambridge, MA (US);

Serge J. Belongie, San Diego, CA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2012.01); G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
G06Q 10/00 (2013.01); G06F 17/30867 (2013.01);
Abstract

A method, system, and computer-readable storage medium for computing a representation of similarity among items in a set of items. Computing a representation of similarity items may comprise generating a first similarity model that represents characteristics of the set of items, the characteristics being indicative of similarity among the items in the set of items. Additionally, computing the representation of similarity may comprise adaptively selecting a subset of the set of items for similarity evaluation based on the first similarity model, receiving a similarity evaluation for the adaptively-selected subset of items, and generating a second similarity model based on the first to similarity model and the received similarity evaluation.


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